X-射线单晶衍射仪易风化晶体低温显微上样系统的研制  

Development of Microscopic Selecting and Sampling System in Low-Temperature Environments for Single Crystal X-Ray Diffractometer to Test Weathering-Suspected Crystals

作　　者：杨培菊[1,2] 沈志强[1,2] 黄晓卷[1,2] 胡霄雪[1,2] 牛建中[2] YANG Pei-ju;SHEN Zhi-qiang;HUANG Xiao-juan;HU Xiao-xue;NIU jian-zhong(State Key Laboratory for Oxo Synthesis and Selective Oxidation, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences,Lanzhou 730000,China;Public Technical Service Center, Lanzhou Institute of Chemical Physics, Lanzhou 730000, China)

机构地区：[1]中国科学院兰州化学物理研究所公共技术服务中心,甘肃兰州730000 [2]中国科学院兰州化学物理研究所羰基合成与选择氧化国家重点实验室,甘肃兰州730000

出　　处：《分析测试技术与仪器》2019年第2期111-113,共3页Analysis and Testing Technology and Instruments

基　　金：中国科学院仪器设备功能开发技术创新项目(2018gl03)

摘　　要：易风化晶体离开母液就会风化并失去结晶溶剂,导致结构塌陷,由单晶变成粉末,从而无法完成测试.X-射线单晶衍射仪易风化晶体低温显微上样系统利用晶体在低温下比较稳定的原理,通过维持选样与上样过程中的低温环境,使易风化晶体能够得以测试,从根本上解决了风化晶体的测试问题.系统的研制为易风化晶体化合物结构的测试提供有力的技术保障,是单晶衍射仪功能开发的重要技术创新.Weathering-suspected crystals will be weathered and lose crystalline solvent after depend from the mother liquor, and result in the structural collapse and turn into powder, thus to test weathering-suspected crystals is very difficult. Making use of the principle that weathering-suspected crystals are usually relatively stable at low temperatures, we developed a special system to help selecting and sampling in low- temperature environment, so that the diffraction data for weathering-suspected crystals cab be obtained. The development of this system provides a strong technical guarantee for the testing of the structure weathering-suspected crystals in related research. It is an important technological innovation in the functional development of single crystal diffractometers.

关 键 词：X-射线单晶衍射仪 单晶 易风化晶体 低温 

分 类 号：O657.34[理学—分析化学]