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作 者:王虎 WANG Hu(China Dangtang Corporation Science and Technology Research Institute,Beijing 100043,China)
机构地区:[1]中国大唐集团科学技术研究院
出 处:《科学技术与工程》2019年第17期179-183,共5页Science Technology and Engineering
摘 要:使用理论分析模型与实验测量相结合的方法,对单晶硅光伏板串联电阻与温度之间的关系进行研究。搭建光伏板温度可控实验台,利用数据采集装置获得光伏板在不同温度下的串联电阻值,使用简化后的Handy模型串联电阻值进行理论计算。实验结果表面,串联电阻随温度的升高而升高,在标准光照强度100 W/cm^2下,单晶硅光伏板电池串联电阻随温度变化曲线斜率为0. 001 9Ω·℃^-1,实测串联电阻随温度变化趋势与理论模型分析结果一致。The calculation formula of photovoltaic( PV) modules series resistance obtained by Handy method is used as the theoretical analysis model. After simplifying the Handy model,with the help of the relationship between width of gate electrode and temperature of PV modules,we can get conclusion that the series resistance increases with temperature increasing. The temperature of the PV panel and the series resistance at different PV temperature can be obtained by test bench. Experimental results show that at standard light intensity of 100 mW/cm^2,monocrystalline silicon PV modules series resistance curvilinear slope with temperature is 0. 001 9 Ω·℃^-1,the tendency of curves varying the same as that of theoretical analysis.
分 类 号:TK511[动力工程及工程热物理—热能工程] TK513
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