Zn（BDC）（4,4’-Bipy）0.5DMF（H2O）0.5在硅及其改性基底上取向生长研究  

Research on oriented growth of Zn（BDC）（4,4’-Bipy）0.5DMF（H2O）0.5 on silicon and its modified substrates

作　　者：齐悦 杨洁[1] 王春霞[1] QI Yue;YANG Jie;WANG Chunxia(Basic Chemistry Experimental Teaching Center,College of Chemistry,Sichuan University,Chengdu,610064,China)

机构地区：[1]四川大学化学学院基础化学实验教学中心

出　　处：《实验技术与管理》2019年第6期69-71,75,共4页Experimental Technology and Management

基　　金：国家自然科学基金项目(51502181);四川大学新世纪高等教育改革工程(第八期)研究项目(SCU8156);四川大学研究生课程建设项目(2018KCJS011)

摘　　要：采用溶剂热和常压合成方法,分别制备MOF-508(Zn(BDC)(4,4’-Bipy)0.5DMF(H2O)0.5)粉末样品及其在Si、Au/Si、COOH-Au/Si基底上的薄膜,通过X射线广角衍射法检测其在基底表面上的取向生长。发现仅在常压法下COOH-Au/Si基底上MOF-508配位聚合物沿着[001]方向生长,用电子扫描电镜技术发现其在COOH-Au/Si基底上的晶体形状统一,多为长方形,说明常压法和基底对其取向生长起到关键性的因素,这对于以后配合物薄膜取向生长提供了参考数据。MOF-508 (Zn(BDC)(4,4’-Bipy) 0.5 DMF(H 2 O) 0.5 ) powder samples and their films on Si, Au/Si and COOH-Au/Si substrates are prepared by solvothermal and atmospheric synthesis methods, respectively, and by X-ray wide-angle diffraction method, the orientation growth on substrate surface is measured. It is found that MOF-508 coordination polymers grow along [001] direction only on COOH-Au/Si substrates under atmospheric pressure. The electron microscopy of electronic scanning has shown that the crystals on COOH-Au/Si substrates are uniform in shape, and most of them are rectangular. The results show that the atmospheric pressure method and the substrates play a key role in the orientation growth of the complex films, which provides a data reference for the orientation growth of the complex films in the future.

关 键 词：配位聚合物薄膜 溶剂热 常压法 取向生长 X射线广角衍射 

分 类 号：TB33[一般工业技术—材料科学与工程]