X射线荧光光谱法测定合金中钨的含量  

Determination of Tungsten in Alloys by X-Ray Fluorescence Spectrometry

作　　者：杨静 曹阳 蕫娇 王跃明 YANG Jing;CAO Yang;DONG Jiao;WANG Yueming(Physical and Chemical Testing Lab. of Shenyang Lim ing Aero Engifie Corporation ,Shenyang 110043,China;Liaoning Zhongivang Group limited Corporation ,Liao yang 111000,China;Shenyang Institute for Product Quality Supervision, Shenyang 110022,China)

机构地区：[1]沈阳黎明发动机公司理化室 [2]辽宁忠旺集团有限公司 [3]沈阳产品质量监督检验院

出　　处：《理化检验（化学分册）》2019年第6期683-686,共4页Physical Testing and Chemical Analysis(Part B:Chemical Analysis)

摘　　要：采用X射线荧光光谱法测定了多种含钨合金钢以及含钨较高的镍基和钴基合金中钨的含量。方法中选择钨的Lβ1线为分析线,并选择2θ角在39.50°处作为背景位置。在合金中钽的Lβ2线对钨分析线有重叠干扰,选两套标准样品用基本参数法(FP)测出了干扰系数k,将k值列入仪器的FP工作软件中来消除钽对钨测定的重叠干扰。用所提出的方法分析了钨质量分数在0.054%~11.71%内的5个标准样品,测定值与认定值相符,测定值的相对标准偏差(n=7)在0.55%~9.5%之间。XRFS was applied to the determination of tungsten in various tungsten containing alloy stees,Nibased and Co-based alloys.The spectral line of Lβ1 of W was chosen as analytical spectral line,and 2θof 39.50°was selected as background site.Spectral line of Lβ2 of Ta was found to interfere with the line of Lβ1 of W.Two sets of standard samples were selected and fundamental parameter(FP)method was used with help of FP software to find out the overlap-interfering coefficient k,which was listed in FP software to eliminate the overlap-interference from Ta to W.5 standard samples with W content ranging from 0.054% to 11.71%,were analyzed by the proposed method,giving results in consistency with the certified values,and RSDs(n=7)ranged from 0.55%to 9.5%.

关 键 词：X射线荧光光谱法 钨 合金 基本参数法 

分 类 号：O657.34[理学—分析化学]