ARGET ATRP调控的硅表面嵌段聚合物刷的制备及性能  

Preparation and Properties of Block Copolymer Brushes Grafted From Silicon Substrate via ARGET ATRP

作　　者：闫春娜 徐琳 王利平[1] 柏丽萍 李光[1] Chuanna Yan;Lin Xu;Liping Wang;Liping Bai;GuangLi(College of Materials Science and Engineering,Liaocheng University,Liaocheng 252059,China;Colege of Materials Science and Engineering,Qingdao University,Qingdao 266071,China)

机构地区：[1]聊城大学材料科学与工程学院,山东聊城252059 [2]青岛大学材料科学与工程学院,山东青岛266071

出　　处：《高分子材料科学与工程》2019年第7期126-131,共6页Polymer Materials Science & Engineering

基　　金：山东省高等学校科技计划项目(J16LA01);国家自然科学基金资助项目(51503094);聊城大学大学生科技文化创新基金(26312161932,26312161927,26312161931,26312171917,26312171930);聊城大学大学生创新训练计划(CXCY2017154)

摘　　要：首先将γ-甲基丙烯酸酯基三甲氧基硅烷(KH570)引入到硅片表面,通过表面引发的电子转移活化再生催化剂原子转移自由基聚合(SI-ARGET ATRP)方法在硅片表面进行接枝聚合,制备出2种不同嵌段聚合物刷——硅片-g-聚苯乙烯-b-聚甲基丙烯酸甲酯(Si-g-PS-b-PMMA)和硅片-g-聚苯乙烯-b-聚N-异丙基丙烯酰胺(Si-g-PS-b-PNIPAM)。通过X射线光电子能谱、核磁共振氢谱和液相凝胶渗透色谱对聚合物和硅片表面的结构进行了测试和分析,结果表明溶液中形成的聚合物相对分子质量分布较窄(在1.1~1.2之间),且分子链末端含有Br,说明聚合过程是按照ARGET ATRP机理进行。三维接触式表面轮廓仪测试结果表明,在接枝嵌段聚合物之后硅表面的表面粗糙度Sa=0.603μm。硅片表面接触角也发生了变化,在接枝聚苯乙烯后表面的接触角变为95.51°,通过接枝甲基丙烯酸甲酯接触角变为80.70°。这些变化进一步证实了硅片表面成功接枝了嵌段聚合物刷。Firstly,γ-methacrylate trimethoxysilane(KH570)was introduced onto the silicon surface.Two different block copolymer brushes--silicon-graft-poly(styrene)-block-poly(methyl methacrylate)(Si-g-PS-b-PMMA)and silicon-graft-poly(styrene)-block-poly(N-isopropyl acrylamide)(Si-g-PS-b-PNIPAM)were prepared via surface-initiated activators regenerated by electron transfer atom transfer radical polymerization(SI-ARGET ATRP)on silicon substrates.The structure of polymers formed in the solution and the silicon substrate was demonstrated by proton nuclear magnetic resonance spectroscopy spectra(1H-NMR),gel permeation chromatograph(GPC)and X-ray photoelectron spectroscopy(XPS),respectively.The results show that the molecular weight distribution is narrow(1.1~1.2),and the end of molecular chain contains bromine,which indicates that the polymerization process follows the ARGET ATRP mechanism.The results of the 3D-surface profilometer(3D-SPM)illustrate that the surface roughness of the silicon surface Sa=0.603μm after grafting the block polymer.The contact angles meter(CA)of the surface changes to 95.51°after grafting polystyrene,and down to 80.70°by the grafting of methyl methacrylate.These changes further confirm the successful grafting of the block polymer brush on the surface of the wafer.

关 键 词：聚合物刷 表面接枝 嵌段聚合物 X射线光电子能谱 

分 类 号：TQ317[化学工程—高聚物工业]