基于穆勒矩阵的金属和电介质识别方法  

Identification of Metals and Dielectrics Based on Mueller Matrix

作　　者：闫振纲 孙卫平[1] 李杰[1] 武江鹏 朱新宏 袁梦笛 薛亮 闫克丁 Yan Zhengang;Sun Weiping;Li Jie;Wu Jiangpeng;Zhu Xinhong;Yuan Mengdi;Xue Liang;Yan Keding(Xi'an Modern Control Technology Institute ,Xi'an ,Shaanxi 71006b,China;College of Electronic and Inform ation Engineering,Shanghai University of Electric Power,Shanghai 200090,China;School of Electronic Inform ation Engineering,Xi'an Technological University,Xi'an , Shaanxi 710021, China)

机构地区：[1]西安现代控制技术研究所,陕西西安710065 [2]上海电力大学电子信息工程学院,上海200090 [3]西安工业大学电子信息工程学院,陕西西安710021

出　　处：《激光与光电子学进展》2019年第14期232-239,共8页Laser & Optoelectronics Progress

基　　金：国家自然科学基金(11804263,11747119)

摘　　要：基于基尔霍夫近似方法,构建了穆勒矩阵全角度分布的数值计算模型,实现了对于金属和电介质随机粗糙表面穆勒矩阵的计算。结果表明,金属和电介质表面穆勒矩阵分布具有明显的差异,金属表面穆勒矩阵中6个元素不为0,电介质表面穆勒矩阵中6个元素均接近于0,并且该差异与材料粗糙程度无关。这种差异可以作为区分金属和电介质的判据,为探索新型的目标探测与识别手段提供了思路。Based on Kirchhoff approximation method,a numerical computation model of Mueller matrix full angle distribution is constructed herein,and Mueller matrix distributions of random rough surfaces of metals and dielectrics are calculated.Results show that there are obvious difference between Mueller matrix distributions of metals and dielectrics;six components of the Mueller matrix of dielectric surfaces are close to 0,whereas those of metal surfaces are non-zero;additionally,the difference is independent of the surface roughness.This difference can act as the robust criterion to distinguish metal and dielectric targets,and can provide new tools in target detection and recognition.

关 键 词：表面光学 光散射 随机粗糙表面 穆勒矩阵 基尔霍夫近似 

分 类 号：O436.2[机械工程—光学工程]