分体对开式高低温发生装置研究  

Research on the Split and Open Type High and Low Temperature Test Chamber

作　　者：高炳涛 杨晓伟[1] 刘云平[1] 梅红伟[1] 钟山 王慧龙[1] GAO Bing-tao;YANG Xiao-wei;LIU Yun-ping;MEI Hong-wei;ZHONG Shan;WANG Hui-long(Beijing Aerospace Institute for Metrology and Measurement Technology,Beijing 100076,China)

机构地区：[1]北京航天计量测试技术研究所

出　　处：《宇航计测技术》2019年第4期38-40,84,共4页Journal of Astronautic Metrology and Measurement

摘　　要：介绍了一种分体对开式高低温发生装置,并详细叙述了其结构组成,测试结果表明高低温发生装置温度范围为-80℃~400℃,温度偏差为±2℃,温度均匀度为2℃,该装置可作为专用实验设备用于力传感器高低温环境下的校准。The split and open type high and low temperature test chamber is introduced. And the composition of its structure is described in detail. The test results show that the temperature range of the high and low temperature test chamber is-80℃~ 400℃,the temperature deviation is ± 2℃,and the temperature uniformity is 2℃. The device can be used as a special device for the calibration of the force sensors at high and low temperature conditions,providing the required high or low temperature test environment for the force sensor.

关 键 词：高低温 温度调节器 温度试验 

分 类 号：TB942[一般工业技术—计量学]