X射线荧光光谱微区分析在元素赋存状态研究中的应用  

Application of In-situ Micro-XRF Spectrometry in the Study of Occurrence State of Elements

作　　者：刘玉纯 梁述廷 刘瑱 林庆文[1] LIU Yu-chun;LIANG Shu-ting;LIU Zhen;LIN Qing-wen(Institute of Geological Experiment of Anhui Province, Hefei 230001,China)

机构地区：[1]安徽省地质实验研究所

出　　处：《安徽化工》2019年第4期115-117,120,共4页Anhui Chemical Industry

摘　　要：结合光学显微镜等其他方法,利用X射线荧光光谱仪微区分析功能,对锰矿石中的Mn元素,辉钼矿中的Mo、S、Re等元素,含黄铁矿包裹体的闪锌矿中的S、Fe、Zn等元素进行微区原位定性或定量分析,研究确定元素在地质体中不同的赋存部位或赋存状态。本法只要将矿石矿物标本制成光片,即可进行微区原位分析,为元素赋存状态研究工作提供一种新的技术手段,同时能够补充和验证其他研究方法。In this paper, in combination with other methods such as light microscope, using X- ray fluorescence(XRF) spectrometer with micro- analysis function, the element Mn in manganese ore, Mo, S, Re and other elements in molybdenite, S, Fe, Zn and other elements in pyrite inclusions in sphalerite, have been analyzed by qualitative or quantitative in- situ micro- analysis and the different occurrence can be determined in the geologic body. As long as ore or mineral specimens are made into polished sections, in- situ micro- analyses are got at once, which provides a new technical means in the research of occurrence state of elements and verifies other research methods in the meantime.

关 键 词：元素赋存状态 X射线荧光光谱 微区分析 

分 类 号：P575[天文地球—矿物学]