ADC INL/DNL测试的直方图方法研究  

Research on the Histogram Method of ADC INL/DNL Testing

作　　者：陈新军[1] 李军求[1] CHEN Xinjun;LI Junqiu(CEPREI,Guangzhou 510610,China)

机构地区：[1]工业和信息化部电子第五研究所

出　　处：《电子产品可靠性与环境试验》2019年第4期77-82,共6页Electronic Product Reliability and Environmental Testing

摘　　要：直方图方法是模数转换器ADC非线性参数INL/DNL测试的主要方法,从采样点数、输入波形方面分析了直方图方法对测试结果的影响。结果表明,利用直方图方法测试ADC的非线性参数时,随着ADC采样点数的增加,测试结果会越来越好,并且方差分析表明测试结果的测定性和可靠性均较理想;斜波信号测试结果略优于正弦波信号,但随着采集点数的增加,两者的测试结果趋于一致,在采样点数理论值附近时,两者基本没有差别。Histogram method is the main method to test the nonlinear parameters of LNL/DNL. And the influence of histogram method on the test results is analyzed from the number of sampling points and the input waveform.The results show that when the nonlinear parameters of the ADC are tested by histogram method,the test results are getting better with the increase of the number of sampling points of ADC,and the analysis of variance shows that the stability and reliability of the test results are ideal.The test results of the ramp signal are slightly better than the sine wave signal,but as the number of sampling points increases,the test results of the two tend to be consistent,and there is basically no difference in the vicinity of the theoretical value of the sampling points.

关 键 词：模数转换器测试 微分非线性 积分非线性 直方图 采样点 输入波形 

分 类 号：TN792[电子电信—电路与系统]