复合直流套管LSR伞裙粉化层与内层的微观对比研究  

Contrastive Study on Microscopic Characteristics of DC Composite Bushing’s LSR Shed Chalking Layer and Inner Layer

作　　者：晏年平 徐驰[3] 陈灿 贾志东[3] YAN Nianping;XU Chi;CHEN Can;JIA Zhidong(State Grid Jiangxi Electric Power Research Institute,Nanchang 330096,China;Department of Electrical Engineering,Tsinghua University,Beijing 100084,China;Graduate School of Tsinghua University,Guangdong Shenzhen 518055,China)

机构地区：[1]国网江西省电力有限公司电力科学研究院,南昌330096 [2]清华大学电机工程与应用电子技术系,北京100084 [3]清华大学深圳研究生院,广东深圳518055

出　　处：《高压电器》2019年第9期134-142,共9页High Voltage Apparatus

基　　金：国家电网公司科技项目(52182015000U)~~

摘　　要：文中以中国南方地区出现粉化现象的高压直流套管液体硅橡胶(LSR)伞裙为对象,借助扫描电子显微镜(SEM)、傅里叶变换红外光谱(FTIR)、X射线衍射图谱(XRD)、X射线光电子能谱(XPS)等微观分析手段,对老化严重的伞裙粉化层和几乎未老化的内层液体硅橡胶进行了对比研究。经过研究发现,粉化层的微观形貌出现不规则片状分层,表面粗糙不平,附着力大大降低。粉化层中聚二甲基硅氧烷(PDMS)侧链有机基团被氧化,交联形成更多Si-O-Si键;粉化层中有TiO2和白炭黑填料发生析出。对应液体硅橡胶的微观老化特性,可提取出多种参数用于定性或半定量反映其老化程度:FTIR光谱中Si-O-Si和Si-C对应吸收峰的峰高之比;XRD衍射图谱中无定形SiO2和PDMS对应衍射峰的积分强度之比;通过XPS分析Si元素细部能谱的分峰拟合得到的硅氧烷链节中Si/O/C平均原子比例等。对液体硅橡胶伞裙样品表层和内层,计算以上参数进行对比,有助于更准确地分析其老化状态。Focused on liquid silicone rubber(LSR)sheds of high-voltage DC bushing operated in South China,this paper analyzed the microscopic characteristics of the sheds’chalking layer and inner layer,using techniques such as scanning electron microscope(SEM),Fourier Transform Infrared Spectroscopy(FTIR),X-ray diffraction(XRD)and X-ray photoelectron spectroscopy(XPS).SEM graphs show that the chalking layer’s micro-surface changes into irregularly shaped patches with a decrease of adhesion.FTIR,XRD and XPS results indicate that in the chalking layer,the side chain groups of polydimethylsiloxane(PDMS)are oxidized,and cross-linked with other siloxane chains,forming more Si-O-Si groups.Furthermore,the precipitation of TiO2 and carbon-white is found in chalking layer.According to the aging behavior of LSR,this paper extracts several characteristic variables to for qualitative aging status evaluation of LSR:the ratio of absorption peaks relevant to Si-O-Si and Si-C chemical bonds in FTIR;the ratio of diffraction peaks relevant to amorphous silica and PDMS in XRD;the average atomic ratios of Si/O/C in siloxane chain units obtained from peak fitting of Si 2p spectrum in XPS,etc.Comparing these characteristic variables of LSR samples’inner and surface layer would help to evaluate the aging status more accurately.

关 键 词：液体硅橡胶 老化 粉化层 FTIR XRD XPS 

分 类 号：TM216.5[一般工业技术—材料科学与工程]