杨氏双缝干涉实验的条纹分布研究  

Study on fringe distribution of Young’s double slit interference experiment

作　　者：李栋玉[1] 时有明[1] 张廷宪[1] LI Dongyu;SHI Youming;ZHANG Tingxian(College of Physics and Electronic Engineering, Qujing Normal University, Qujing 655011, China)

机构地区：[1]曲靖师范学院物理与电子工程学院

出　　处：《实验技术与管理》2019年第10期120-122,126,共4页Experimental Technology and Management

基　　金：国家自然科学基金项目(31760341)资助;云南省教育厅科研项目(2015Y425)资助

摘　　要：为了研究杨氏双缝干涉实验条纹的分布情况,通过理论推导结合Origin软件仿真得出干涉条纹的分布图像,计算出不同区间内条纹的宽度.对干涉条纹宽度变化规律的曲线拟合分析显示,条纹的宽度随偏离图样中心距离的增加呈现指数增长,这一增长趋势在远场区域非常明显.对比教材中使用二次近似处理计算近场区域条纹宽度的结果,发现当-0.01 m≤x≤0.01 m时,仿真结果与近似处理的计算结果一致.In order to study the distribution of interference fringes in Youngˇs double slit interferometry experiment, the distribution image of interference fringes is obtained by the theoretical deduction and Origin software simulation, and the width of interference fringes in different intervals is calculated. Curve fitting analysis of the variation law of interference fringe width shows that the fringe width increases exponentially with the increase of the distance x from the center of the pattern, which becomes more obvious in the far-field region. As compared with the results of calculating fringe widths in near-field region by using second approximation in textbooks, it is found that when it is -0.01 m≤x≤0.01m, the simulation results are in agreement with the results of approximation.

关 键 词：双缝干涉 干涉条纹 仿真实验 光学实验 

分 类 号：O436.1[机械工程—光学工程]