A Descriptor System Approach of Sensor Fault State Estimation for Sampled-data Systems  

A Descriptor System Approach of Sensor Fault State Estimation for Sampled-data Systems

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作  者:Zhenhua Zhou Mao Wang Boyuan Yang 

机构地区:[1]Changzhou Vocational Institute of Light Industry, Changzhou 213164, Jiangsu China [2]Department Space Control and Inertial Technology Research Center, Harbin Institute of Technology, Harbin 150001, China

出  处:《Journal of Harbin Institute of Technology(New Series)》2019年第5期60-66,共7页哈尔滨工业大学学报(英文版)

基  金:Sponsored by the National Natural Science Foundation of China(Grant No.61004038)

摘  要:This paper proposes a fault estimation method for sampled data systems with sensor faults. The sampled data system is firstly discretized to obtain a discrete time model. Then a descriptor system is constructed to describe the discretized system with sensor faults. Based on the descriptor system representation a bank of observers are designed to isolate and estimate the sensor faults. These observers can be synthesized by the linear matrix inequality (LMI) technique and sufficient conditions for the existence of these observers are derived. Finally the effectiveness is ascertained by an aircraft simulation example which is in the proposed method.This paper proposes a fault estimation method for sampled-data systems with sensor faults. The sampled-data system is firstly discretized to obtain a discrete-time model. Then a descriptor system is constructed to describe the discretized system with sensor faults. Based on the descriptor system representation, a bank of observers are designed to isolate and estimate the sensor faults. These observers can be synthesized by the linear matrix inequality(LMI) technique, and sufficient conditions for the existence of these observers are derived. Finally, the effectiveness is ascertained by an aircraft simulation example, which is in the proposed method.

关 键 词:FAULT isolation and estimation SAMPLED-DATA SYSTEM DESCRIPTOR SYSTEM linear matrix INEQUALITY (LMI) 

分 类 号:TP29[自动化与计算机技术—检测技术与自动化装置]

 

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