有色金属带材的IDC-MFM电磁无损检测方法  

IDC-MFM electromagnetic non-destructive testing method for nonferrous metal strips

作　　者：李冬林[1] 高见 涂君[1] 宋小春[1] LI Donglin;GAO Jian;TU Jun;SONG Xiaochun(School of Mechanical Engineering,Hubei University of Technology,Wuhan 430068,China)

机构地区：[1]湖北工业大学机械工程学院

出　　处：《传感器与微系统》2019年第11期15-18,22,共5页Transducer and Microsystem Technologies

基　　金：国家自然科学基金资助项目(51575165,51707058);湖北工业大学科研启动金资助项目(BSQD2017007)

摘　　要：针对有色金属带材的检测需求,研究一种直流通电—磁场测量(IDC-MFM)的电磁无损检测方法,该方法通过给被测试件导入直流电流并采用高灵敏度的磁敏感探头探测因缺陷引起的磁场变化来实现导电材料的检测。根据通电平板的三维磁场仿真结果,分析了无缺陷、有凹槽缺陷和凸起缺陷时平板及周围空间的磁场分布特性,并研究了缺陷附近的横向磁感应强度的变化特点和缺陷信号特征。对铜带和铝带样本开展探伤实验,实验结果与仿真信号一致性表明IDC-MFM检测方法可以对有色金属带材的凹坑、凸起、鼓包等缺陷和边缘缺陷进行检测。For the requirement of inspecting nonferrous metal strips,the injected direct current-magnetic field measurement(IDC-MFM) method is studied.This method realizes inspection for conductive materials by injecting direct current into the tested object to induce magnetic field and using high sensitivity magnetic sensing probe to detect the magnetic field change.According to the results of three-dimensional magnetic field simulation,the distribution characteristics of magnetic field surrounding the tested plate is analyzed when the plate has non-defect,convex defect and concave defect.At the same time,the variation characteristics of transverse magnetic flux density surrounding defect and the signal feature of defects are researched.The inspecting experiments for copper and aluminum strips samples are performed.The experimental results are consistent with the simulation,which indicates that IDC-MFM method has the capability of inspecting convex defects,concave defects,ridgy defects and marginal defects on nonferrous metal strips.

关 键 词：有色金属 直流电流 磁场测量 缺陷 信号 

分 类 号：TG115[金属学及工艺—物理冶金] TP212[金属学及工艺—金属学]