R_s标准测量系统的研究及其误差讨论  

RESEARCH OF STANDARD MEASUREMENT SYSTEM OF THE SURFACE RESISTANCE AND ITS ERROR DISCUSSION

作　　者：许华嵘[1] 吴立勇[1] 施建荣[1] 曹春海[1] 蔡卫星[1] 孙国柱[1] 王相元[1] 钱鉴[1] 杨森祖[1] 吉争鸣[1] 程其恒[1] 吴培亨[1] 

机构地区：[1]南京大学电子科学与工程系,210093

出　　处：《低温物理学报》2002年第4期268-275,共8页Low Temperature Physical Letters

摘　　要：本文主要介绍了按照目前国际上制定的超导薄膜表面阻抗Rs 标准测量方案 (IEC/TC90 )设计并制造的Rs标准测量系统 ,对实验过程中系统的细节作了改进 ,测试精度及可靠性作了分析 ,实验及结果证明该标准的可行性 ,同时说明了我们的测试系统符合国际超导薄膜表面阻抗RsWe designed and fabricated Standard measurement System of the Surface Resistance according to the draft of standard measurement of HTS surface resistance (IEC/TC90). We improved some details of the measurement system and analyzed the precision of measuring and the reliability of the experiment. The results proved that the standard is reasonable and our measurement system satisfied the requirement of the IEC/TC90 standard for HTS surface resistance.

关 键 词：标准测量系统 误差 超导薄膜 无源微波器件 超导体 表面阻抗Rs 

分 类 号：O511.9[理学—低温物理]