Micro-beam XRF localization by a laser beam  

作　　者：GUOPanlin WANGJiqing 等 

机构地区：[1]ShanghaiInstituteofNuclearResearch,ChineseAcademyofSciences,Shanghai201800 [2]ShanghaiInstituteofNuclear

出　　处：《Nuclear Science and Techniques》1999年第4期225-229,共5页核技术（英文）

摘　　要：A new method for micro-beam XRF localiztion is presented.A laser beam along with an incident X-ray hits on the surface of a sample.The micro region on the sample that reached by X-ray beam can be localized by means of the visible spot of the laser beam.This method is suitable for X-ray microprobes using an X-ray tube or synchrotron radiation as excitation sources.A new method for micro-beam XRF localization is presented. A laser beam along with an incident X-ray hits on the surface of a sample. The micro region on the sample that reached by X-ray beam can be localized by means of the visible spot of the laser beam. This method is suitable for X-ray microprobes using an X-ray tube or synchrotron radiation as excitation sources.

关 键 词：激光束 λ射线束 化合物分析 

分 类 号：O432.12[机械工程—光学工程]