CORRECTION　OF　INFLUENCE　OF　SUBSTRATE　ON　MEASUREMENT　OF　INNER　SHELL　IONIZATION　CROSS　SECTIONS  

作　　者：罗正明 安竹 何福庆 李泰华 龙先灌 彭秀峰 

出　　处：《Nuclear Science and Techniques》1995年第3期164-167,共4页核技术（英文）

摘　　要：The energy spectra of reflected electrons from the substrates of targets have been calculated by the bipartition model of electron transport, the contributions of the inner shen ionization events produced by the reflected electrons from the substrates in the targets to the x-ray counting in a St(Li) detector have been estimated. It has been confirmed that, by such correction to the measured data, the experimental results of inner shell ionization cross sections by electron impact with fine precision may be obtained under the condition of thick substrate.

关 键 词：Inner shell ionization cross section Bipartition model of electron  transport Target with thick substrate 

分 类 号：O571[理学—粒子物理与原子核物理] O614.813[理学—物理]