感光材料光电子的微波相敏检测技术  

The Technique of Microwave Phase-sensitive Detecting the Photoelectrons of Silver Halide

作　　者：韩理[1] 陆晓东[1] 杨少鹏[1] 李晓苇[1] 耿爱丛[1] 

机构地区：[1]河北大学物理科学与技术学院,保定071002

出　　处：《信息记录材料》2002年第4期57-61,共5页Information Recording Materials

基　　金：教育部重点科研项目(01011);河北省自然科学基金(199104)

摘　　要：讨论了微波相敏检测法的原理,重点对感光材料薄膜在曝光过程中光电子引起的介电函数的变化以及由此导致的微波谐振腔反射波电压变化进行了详细的分析,介绍了实现同步检测自由光电子和浅束缚电子信号的微波相敏检测装置。The mechanism of microwave phase-sensitive method has been discussed in detailed. Especially two main parts of the method, the changes of dielectric function caused by the photoelec-trons that are generated in the process of exposure and the corresponding change of the reflected voltage of cavity, have been analyzed in particular. Then introduce the device of microwave phase-sensitive technique and the detecting processes of free photoelectrons and shallow-trapped electrons simultaneously.

关 键 词：感光材料 光电子 微波相敏检测技术 介电函数 

分 类 号：TQ577.7[化学工程—精细化工]