一种新的KLEED/CMTA方法(Ⅲ)——适用于由不同种原子构成的表面  

New KLEED/CMTA Method Approach——for Surfaces Consisting of Different Atoms

作　　者：贾金峰[1] 赵汝光[1] 杨威生[1] 

机构地区：[1]北京大学物理学系,北京100871

出　　处：《Journal of Semiconductors》1992年第10期646-653,共8页半导体学报（英文版）

基　　金：国家自然科学基金

摘　　要：本文在运动学低能电子衍射(KLBED)计算方法中引入了一个平均复原子散射因子,以期使这种KLEED方法能用于由不同种原子构成的表面,而且还能大大节省计算时间.我们在多种表面上用动力学低能电子衍射(DLEED)计算对它进行了检验,结果表明这种新的KLEED计算方法和 LEED实验强度的 CMTA平均方法相结合是一种十分简单、有效的表面结构分析方法.这一方法已被成功地应用于Si(111)3^(1/2)× 3^(1/2)-Ag 表面结构研究.We have introduced an averaged complex atomic scattering factor into the kinematic low en-ergy electron diffraction (KLEED) approach in order to make it applicable to surfaces consist-ing of different kinds of atoms, moreover, to make it much more effective than the approachesin earlier works. To verify the validity of the new approach, we carried out dynamic LEEDcalculations on three different types of surfaces with given structures. The results show thatthe new KLEED approach in conjunction with the Constant Momentum Transfer Averagedexperimental LEED intensity curves is a very simple and effective method for surface crystal-lograph. The approach has been successfully applied to the determination of the structureof the Si(111) 3^(1/2)×3^(1/2)-Ag surface.

关 键 词：KLEED/CMTA 原子 结构表面 计算 

分 类 号：O571.2[理学—粒子物理与原子核物理]