Measurement of Sc and V K-shell ionization cross sections by slow electron impact  

Measurement of Sc and V K-shell ionization cross sections by slow electron impact

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作  者:李泰华 安竹 罗正明 

机构地区:[1]InstituteofNuclearScienceandTechnology,SichuanUniionUniversity,Chengdu610064

出  处:《Nuclear Science and Techniques》1996年第4期228-231,共4页核技术(英文)

摘  要:MeasurementofScandVK-shellionizationcrosssectionsbyslowelectronimpactLiTai-Hua(李泰华),AnZhu(安竹)andLuoZheng-Ming(罗正明)(Instituteo...Electron-induced Sc and V K-shell ionization cross sections,which are scarce,have been obtained from measurement of Kα X-ray emission cross sections at energies from near threshold to 25 keV.The influence of substrate of thin targets on ionization cross sections has been corrected using the bipartition model of electron transport.

关 键 词:原子K层离化 截面测量 幔电子碰撞 

分 类 号:O562.4[理学—原子与分子物理]

 

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