轫致辐射能谱测定SSC高频腔体电压  

Measurement of SSC RF cavity voltage with X-ray spectrum method

作　　者：郑启文[1] 张生虎[1] 高宜海[1] 郁奇[1] 俞鸣峰[1] 

机构地区：[1]中国科学院近代物理研究所,甘肃兰州730000

出　　处：《核电子学与探测技术》2002年第6期524-526,共3页Nuclear Electronics & Detection Technology

摘　　要：介绍了利用轫致辐射能谱测定回旋加速器高频腔体电压的原理、方法及测量结果。该测量方法的优点在于采用非接触方式测量高频腔体电压 ,因而不改变高频腔体的谐振特性 ,并且不受高频频率的影响 ,测量的高频腔体电压准确可靠。This paper introduces the principle, method and results of RF voltage amplitude measurement by using X-ray energy spectrum. X-ray spectrum measurement method is one well-known method of absolute voltage measurement. It is based on the measurement of X-ray spectrum generated by field emitted (FE) electrons in RF cavity. The voltage amplitude of RF cavity measured by X-ray spectrum method is accurate and reliable. The DEE voltage of HIRFL-SSC cyclotron has been calibrated by X-ray spectrum measurement results.

关 键 词：轫致辐射能谱 测定 SSC 高频腔体 电压 连续能谱 回旋加速器 

分 类 号：TL542[核科学技术—核技术及应用]