光电转换器件的伏安特性的快速测试方法设计及实现  

Design and Implementation of Fast Testing Method in Photoelectric Conversion Device’s Voltage-Ampere Characteristic Measurement

作　　者：程天霁 周辰辉 苏丹 杨晨曦 赵宁[1] CHENG Tianji;ZHOU Chenhui;SU Dan;YANG Chenxi;ZHAO Ning(School of Electronic Science and Engineering,Southeast University,Nanjing 210096,China;School of Instrument and Meter Engineering,Southeast University,Nanjing 210096,China)

机构地区：[1]东南大学电子科学与工程学院,南京210096 [2]东南大学仪器科学与工程学院,南京210096

出　　处：《电子器件》2019年第4期914-919,共6页Chinese Journal of Electron Devices

基　　金：国家级大学生创新训练项目(201810286037)

摘　　要：通过硅光电转换器件的热平衡方程及其单指数模型,分析了温度改变对器件的实际测试精度的影响。基于数字源表和虚拟仪器平台LabVIEW,针对电压线性扫描测试过程中脉冲上升沿对测试时间的限制问题,设计了电压脉冲上升沿进行器件伏安特性测试方案,测试时间缩短为130μs,开路电压及光电转换效率均有1%~2%的提升。实验证明该方法能够实现对光电器件的伏安特性的快速测量及有效提高测试精度。The influence of temperature change on the test accuracy of the device is analyzed through the heat balance equation of the photoelectric conversion device and its single exponential mode.Based on the digital source meter and the virtual instrument platform LabVIEW,test during the rising edge of the pulse is designed to deal with the testing time limitation which is caused by the positive edge.The test time is as short as 130 microseconds.Both voltage and photoelectric conversion efficiency are improved by 1%~2%.Experiments show that the method can quickly measure the volt-ampere characteristics of photovoltaic devices and effectively improve the test accuracy.

关 键 词：光电转换器件 LABVIEW 脉冲上升沿 伏安特性测试 

分 类 号：TN21[电子电信—物理电子学]