独石电容器失效模式与机理分析  

Failure Mode and Failure Mechanism Analysis of Monolithic Capacitor

作　　者：范士海[1] FAN Shi-hai(Aerospace Science&Industry CORP Defense Technology R&T Center,Beijing 100854)

机构地区：[1]航天科工防御技术研究试验中心

出　　处：《环境技术》2019年第4期44-47,共4页Environmental Technology

摘　　要：本文通过典型失效案例,对独石电容器常见的失效模式,即短路、开路、电参数漂移及其它物理变化(如端电极脱落、瓷体炸裂)进行了系统的总结,对造成独石电容器失效的原因与机理进行了详细的阐述,在此基础上,有针对性的提出了避免独石电容器装机使用后失效的有效措施。By the introduction of typical FA cases,the common failure mode of monolithic capacitor,i.e.short circuit,open circuit,out-of-tolerance of parameter,and other physical change(such as electrode fall off,ceramic body crack)is systematically summarized.The failure causes and mechanism of monolithic capacitor are elaborated.On the basis of the analysis,the control measures to prevent occurrence of failure of used components are proposed.

关 键 词：独石电容器 失效模式 失效机理 

分 类 号：TM53[电气工程—电器]