基于EFSM的最小测试用例集生成方法  

EFSM-based minimal test case set generation algorithm

作　　者：陈孔婷 王兴起[1] CHEN Kong-ting;WANG Xing-qi(School of Computer Science and Technology,Hangzhou Dianzi University,Hangzhou 310018,China)

机构地区：[1]杭州电子科技大学计算机学院

出　　处：《计算机工程与设计》2019年第9期2502-2506,共5页Computer Engineering and Design

基　　金：浙江省自然科学基金项目(LQ16F020006、LY17F020023)

摘　　要：影响测试成本的主要因素是测试用例集规模和测试用例的总长度,为降低测试成本,对测试用例生成技术进行研究,提出一种基于集合覆盖理论的最小测试用例集生成方法。设计迁移覆盖算法,其中引入关键迁移概念,设计最小测试用例集算法用于合并迁移覆盖算法输出的集合,得到最小测试用例集。实验结果表明,所提方法得到的最小测试用例集,降低了测试成本,提高了测试效率。The main factors affecting the test cost are the scale and the total length of the test case.To reduce the test cost,the test case generation technology was studied,and a minimum test case set generation method based on the set coverage theory was proposed.The transition coverage algorithm was designed,in which the key transition concept was introduced.The minimum test case set algorithm was designed to merge the output set of the transition coverage algorithm.The minimum test case set was obtained.Experimental results show that the minimum test case set obtained using the proposed method reduces the test cost and improves the test efficiency.

关 键 词：扩展有限状态机 最小测试用例集 迁移覆盖 测试成本 测试效率 

分 类 号：TP311.5[自动化与计算机技术—计算机软件与理论]