HNS多点阵列装药慢速烤燃试验研究  

Slow Cook-off Test of HNS Multi-point Array Charge

作　　者：秦国圣[1] 都振华[1] 王可暄[1] 王寅[1] 周密[1] QIN Guo-sheng;DU Zhen-hua;WANG Ke-xuan;WANG Yin;ZHOU Mi(Shaanxi Applied Physics and Chemistry Research Institute,Xi′an 710061,China)

机构地区：[1]陕西应用物理化学研究所

出　　处：《装备环境工程》2019年第9期34-39,共6页Equipment Environmental Engineering

摘　　要：研究多点阵列冲击片雷管装药的热安全性。方法针对φ3 mm×3 mm、φ4 mm×4 mm、φ5 mm×5 mm、φ4 mm×8 mm共四种不同尺寸的HNS多点阵列装药开展慢速烤燃试验研究,得到HNS多点阵列装药在3.3℃/h、5、10℃/min三种不同升温速率下的响应特性。结果同规格装药情况下,随着升温速率的提高,其热烤响应剧烈程度有加剧趋势;同升温速率条件下,试样药量越大,反应剧烈程度有加剧趋势。结论阵列装药有利于分散HNS装药在热烤条件下的热积累,降低热烤试验的响应强度,提升装药的热安全性。Objective To research the heat stability of multi-point array EFI charge. Methods The slow cook-off tests of HNS multi-point array charge according to four different sizes, φ3 mm×3 mm,φ4 mm×4 mm,φ5 mm×5 mm,φ4 mm×8 mm, were carried out. The response characteristics of HNS multi-point array charge in three different heating rates 3.3 ℃/h, 5, 10 ℃/min were obtained. Results The test responses had an increasing trend with the improvement of heating rate under the same charge condition. The test responses have an increasing trend with the improvement of charge at the same heating rate condition. Conclusion Array charge is benefit to dispersing the heat accumulation of HNS charge, reducing the response strength in the cook-off test, and increasing the thermal safety of charge.

关 键 词：慢速烤燃 六肖基菧(HNS) 多点阵列 冲击片雷管 火工品 

分 类 号：TJ450[兵器科学与技术—火炮、自动武器与弹药工程]