嵌入式高速存储器中数据质量控制方法分析  

Analysis of data quality control method for embedded high-speed memory

作　　者：郭杰 Guo Jie(Computer AcademyOf Xi’An Aeronautical University,Xi’An 710077,China)

机构地区：[1]西安航空学院计算机学院

出　　处：《电子测量技术》2019年第18期118-122,共5页Electronic Measurement Technology

基　　金：国家自然基金(61871313);西安航空学院校级科研基金(2016KY1211)项目资助

摘　　要：为提升Flash存储器中的数据质量水平,达到SOC芯片对大容量数据高速率、可靠性的存储需求,首先介绍了嵌入式Flash高速存储器的应用性能及基本构成,并透过FLASH存储器中数据坏块和位交换故障对数据存储质量的影响性,引入基于阈值控制的损耗均衡算法,将损耗均分至不同的物理块上,控制坏块发生率;同时,融合ECC校验算法对发生位交换故障的数据进行修正。研究发现,损耗均衡算法通过将各数据块的擦除次数达到近似均衡,延长了Flash存储器的使用寿命,而ECC通过写校验码和读校验码的异或运算,便可实现对错误数据的纠正,两种算法的流程简单、可操作性强,可对Flash存储器数据质量进行有效控制。In order to improve the data quality level in Flash memory and meet the requirement of SOC chip for large-capacity data high-speed and reliability storage,this paper first introduced the application performance and basic structure of embedded Flash high-speed memory,and through the influence of bad data blocks and bit exchange faults in FLASH memory on data storage quality,a loss equalization algorithm based on threshold control was introduced,which divided the loss into different physical blocks to control the occurrence rate of bad blocks.At the same time,the data of bit-switching faults were corrected by combining ECC verification algorithm.It is found that the loss equalization algorithm can extend the life of Flash memory by approximating the erasure times of each data block.ECC can correct the wrong data by writing and reading the exclusive or operation of the check codes.The two algorithms have simple flow and strong operability,and can effectively control the data quality of Flash memory.

关 键 词：FLASH存储器 数据质量控制 损耗均衡算法 ECC校验算法 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]