LabVIEW、Matlab在ADC通用化测试平台中的应用  

Application of LabVIEW and Matlab in ADC Universal Test Platform

作　　者：钱宏文[1] 刘继祥 李凯 Qian Hongwen

机构地区：[1]中国电子科技集团公司第五十八研究所

出　　处：《工业控制计算机》2019年第11期7-9,共3页Industrial Control Computer

摘　　要：目前国内大多数ADC测试平台通用性差,一般只能满足一款或几款ADC芯片指标测试,可扩展性差,不能很好满足客户需求。为了解决ADC测试平台通用性差问题,硬件上采用FPGA+SOC的架构,支持LVDS、COMS、JESD204B等接口实现数据的采集和传输,同时还支持多种接口电压,使得该平台能适应各种电压接口的ADC;软件方面采用LabVIEW+Matlab架构,通过更新数据库、配置文件、Matlab算法(COM组件)、FPGA程序等功能模块,以此实现不同型号芯片快算测试。通过对多种不同型号芯片进行测试,对比芯片手册,验证该平台的可行性。In order to solve the problem of poor universality of ADC test platform,the hardware adopts the architecture of FPGA+SOC,supports LVDS,COMS,JESD204B interface to realize data acquisition and transmission,and also supports a variety of interface voltages,which makes the platform adapt to ADC of various voltage interfaces;software uses LabVIEW+Matlab architecture,through updating the database,configuration files,Matlab algorithm(com components),program of FPGA are used to realize fast calculation test of different types of chips.The feasibility of the platform is verified by testing different types of chips and comparing the chip manuals.

关 键 词：LABVIEW MATLAB COM组件 通用化 ADC测试 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]