WTe2在室温下的红外纳米成像  

Infrared nanoimaging of WTe2 at room temperature

作　　者：罗国语 代珍兵 李志强[1] 王冲[2,3] 晏湖根 于白茹[1] LUO Guo-Yu;DAI Zhen-Bing;LI Zhi-Qiang;WANG Chong;YAN Hu-Gen;YU Bai-Ru(College of Physics,Sichuan University,Chengdu 610065,China;State Key Laboratory of Applied Surface Physics,Fudan University,Shanghai 200438,China;Department of Physics,Fudan University,Shanghai 200438,China)

机构地区：[1]四川大学物理学院,成都610065 [2]复旦大学应用表面物理国家重点实验室,上海200438 [3]复旦大学物理学系,上海200438

出　　处：《四川大学学报（自然科学版）》2019年第6期1093-1096,共4页Journal of Sichuan University(Natural Science Edition)

摘　　要：本文用扫描散射近场光学显微镜(s-SNOM)在室温下研究了碲化钨(WTe 2)的近场光学响应,利用有限偶极模型计算了WTe 2样品与金刚石基底的近场散射信号比,发现观测结果并不能完全由块材所描述,从而推测出样品表面具有与块材无耦合作用的WTe 2纳米薄层,并对在样品边缘发现的很强的亮纹做出了可能的解释.这个工作为今后对拓扑材料的光学研究提供了参考.We use scattering scanning near field optical microscopy to investigate the near field response of tungsten ditelluride(WTe 2).By using finite-dipole model we calculate the scattered signal ratio of sample to diamond substrate and find that it cannot be fully described by bulk property.This difference is most likely contributed to the decoupled layer on the bulk WTe 2.Then we give possible explanations to the bright fringe at the sample edge.This work provides a reference for the optical research of topological materials in the future.

关 键 词：碲化钨 拓扑材料 近场光学 边缘态 

分 类 号：O469[理学—凝聚态物理]