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作 者:张建锋[1] 刘汉彬[1] 金贵善[1] 石晓[1] 韩娟[1] 李军杰[1] 张佳[1] 郭东侨[1] ZHANG Jianfeng;LIU Hanbin;JIN Guishan;SHI Xiao;HAN Juan;LI Junjie;ZHANG Jia;GUO Dongqiao(Beijing Research Institute of Uranium Geology,Beijing 100029,China)
机构地区:[1]核工业北京地质研究院
出 处:《铀矿地质》2019年第6期359-365,共7页Uranium Geology
基 金:国家重点研发计划项目“华南热液型铀矿基地深部探测技术示范”(编号:2017YFC0602600);“相山大型铀矿田科学深钻Ⅱ期铀多金属深部探测研究”项目联合资助
摘 要:在原有五氟化溴-硅同位素组成分析方法及样品制备装置基础上,对分析方法进行优化并对样品制备装置进行改进。改进的样品制备装置包含12套独立的硅同位素样品制备、分离、纯化及收集单元,可同时对12件样品进行分离、纯化及收集,提高了制备效率。以国家标准物质GBW04421、石英单矿物以及硅质岩地质样品为参考,在改进的装置上进行硅同位素样品制备分析,其分析精度分别为0.08‰、0.07‰和0.08‰,均优于0.1‰,标准物质δ^30Si的测量平均值为-0.04‰,在误差范围内与标准值-0.02‰相吻合。样品制备效率及分析结果表明:改进的硅同位素样品制备装置及分析方法测量结果准确可行。Based on the traditional analysis method and sample preparation device for silicon isotopic compositions by BrF5,some improvement was made to optimize the analysis method and the sample preparation device.The improved sample preparation device includes 12 sets of independent units which have enhanced the preparation efficiency by simultaneously preparing,separating,purifying and collecting the sample.The national standard material GBW04421,quartz,and siliceous rock samples were used as the reference to test the improved device for the preparation,and analysis of silicon isotopic compositions.The analytical accuracy is 0.08‰,0.07‰and 0.08‰,respectively,which are less than 0.1‰.The average value of the standard material is-0.04‰,which is in good agreement with the recommended data-0.02‰.The analytical accuracy and value of standard material suggested that the improved preparation device and method is suitable for the analysis of silicon isotopic compositions.
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