基于VME总线信号处理机通用测试平台  

General Test Platform for Signal Processor Based on VME Bus

作　　者：李学军 陆红茂 Li Xuejun;Lu Hongmao(715 Institute,Hangzhou Zhejiang,310023;726Institute,Shanghai,200436)

机构地区：[1]第七一五研究所,浙江杭州310023 [2]第七二六研究所,上海200436

出　　处：《电子测试》2019年第22期58-59,100,共3页Electronic Test

摘　　要：该平台采用多任务并行测试与数据通信口并行交叉饱和测试等方法,解决了高速数字信号处理芯片性能测试的关键技术问题;采用FFT和时域相关算法,分别进行多通道模拟信号的幅频特性和相位特性的性能测试,解决了模拟信号多通道一致性自动快速测试的问题。通过该测试手段,可以有效地观测幅频特性、相位差、逻辑接口、LINK口及信号处理芯片的工作状态,将故障定位到芯片级。The platform adopts multi-task parallel testing and data communication interface parallel cross-saturation testing methods to solve the key technical problems of performance testing of highspeed digital signal processing chips;uses FFT and time-domain correlation algorithm to test the amplitude-frequency and phase characteristics of multi-channel analog signals, respectively. The problem of automatic and fast test for multi-channel consistency of analog signals is solved. Through this test method, the amplitude-frequency characteristics, phase difference, logic interface, LINK port and the working state of signal processing chip can be effectively observed, and the fault can be located at the chip level.

关 键 词：COTS VME总线 DSP板 A/D板 D/A板 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]