FPGA在辐照环境下的故障注入系统研究  

Research on fault injection system of FPGA in irradiation environment

作　　者：薛晓良 苏海冰[1] 舒怀亮[1] 郭帅[1] 吴威[1] Xue Xiaoliang;Su Haibing;Shu Huailiang;Guo Shuai;Wu Wei(Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu,Sichuan 610209,China;University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]中国科学院光电技术研究所,四川成都610209 [2]中国科学院大学,北京100049

出　　处：《光电工程》2019年第12期21-27,共7页Opto-Electronic Engineering

摘　　要：对XilinxSRAM型FPGA的配置RAM的帧物理组织进行了研究,给出了提取帧结构的方法,并给出了比特流中帧的排列顺序;分析了SEMIP核的中间文件的结构并给出了提取必要位的方法,通过对必要位进行0/1翻转,用以模拟辐射环境下FPGA易出现的单粒子翻转问题;设计了PC端界面以实现完整的人机交互。故障注入系统在FPGA片上实现,通过内部ICAP接口实现对配置数据的读写,无需处理器参与。通过对待测电路的必要位逐位进行翻转及修复测试后对每个位进行了分类,分类结果可用于在后续故障修复中对特殊位进行重点防护。This article studied the frame structure of Xilinx FPGA configuration RAM, giving the method of extracting the frame structure and providing the order of frames in the bit stream file. The structure of the intermediate file of SEM IP core is also analyzed to get the positions of essential bits. Performing 0/1 flipping on the essential bits is a way to simulate the single event upset which the circuit is sensitive to under the radiation environment. A PC-side interface is designed to implement a human-machine interaction. The fault injection system is implemented on the FPGA chip, and the read and write of configuration RAM data are realized through ICAP without the need of the processor. The operation of flipping and repairing test classifies essential bits into some categories. The classification results can be used to protect the key bits in subsequent fault repairing.

关 键 词：SRAM型FPGA 单粒子翻转SEU 配置RAM ICAP 故障注入 

分 类 号：V302.8[航空宇航科学技术]