机构地区:[1]Key Laboratory of Wheat Biology and Genetic Improvement for Low&Middle Yangtze Valley,Ministry of Agriculture,Lixiahe Region Institute of Agricultural Sciences of Jiangsu Province,Yangzhou 225007,Jiangsu,China [2]International Maize and Wheat Improvement Center(CIMMYT),Apdo.Postal 6-64a,06600 Mexico D.F.,Mexico
出 处:《The Crop Journal》2019年第6期809-818,共10页作物学报(英文版)
基 金:supported by the Bill and Melinda Gates Foundation and the United States Agency for International Development (USAID) through the Cereal Systems Initiative for South Asia (CSISA), Durable Rust Resistance in Wheat (DRRW)/Delivering Genetic Gains in Wheat (DGGW) and the CGIAR Research Program for Wheat (CRP WHEAT) project;the financial support of The National Key Research and Development Program of China on Molecular Design Breeding in Wheat (2016YFD0101802)
摘 要:Tan spot(TS) and Septoria nodorum blotch(SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in grain yield. In this study, two recombinant inbred line populations, ‘Bartai’ × ‘Ciano T79’(referred to as B × C) and ‘Cascabel’ × ‘Ciano T79’(C × C) were tested for TS and SNB response in order to determine the genetic basis of seedling resistance. Genotyping was performed with the DAr Tseq genotypingby-sequencing(GBS) platform. A chromosome region on 5 AL conferred resistance to TS and SNB in both populations, but the effects were larger in B × C(R^2= 11.2%–16.8%) than in C × C(R^2= 2.5%–9.7%). Additionally, the chromosome region on 5BL(presumably Tsn1)was significant for both TS and SNB in B × C but not in C × C. Quantitative trait loci(QTL)with minor effects were identified on chromosomes 1B, 2A, 2B, 3A, 3B, 4D, 5A, 5B, 5D, 6B,and 6D. The two CIMMYT breeding lines ‘Bartai’ and ‘Cascabel’ contributed resistance alleles at both 5AL and 5BL QTL mentioned above. The QTL on 5AL showed linkage with the Vrn-A1 locus, whereas the vrn-A1 allele conferring lateness was associated with resistance to TS and SNB.Tan spot(TS) and Septoria nodorum blotch(SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in grain yield. In this study, two recombinant inbred line populations, ‘Bartai’ × ‘Ciano T79’(referred to as B × C) and ‘Cascabel’ × ‘Ciano T79’(C × C) were tested for TS and SNB response in order to determine the genetic basis of seedling resistance. Genotyping was performed with the DAr Tseq genotypingby-sequencing(GBS) platform. A chromosome region on 5 AL conferred resistance to TS and SNB in both populations, but the effects were larger in B × C(R2= 11.2%–16.8%) than in C × C(R2= 2.5%–9.7%). Additionally, the chromosome region on 5 BL(presumably Tsn1)was significant for both TS and SNB in B × C but not in C × C. Quantitative trait loci(QTL)with minor effects were identified on chromosomes 1 B, 2 A, 2 B, 3 A, 3 B, 4 D, 5 A, 5 B, 5 D, 6 B,and 6 D. The two CIMMYT breeding lines ‘Bartai’ and ‘Cascabel’ contributed resistance alleles at both 5 AL and 5 BL QTL mentioned above. The QTL on 5 AL showed linkage with the Vrn-A1 locus, whereas the vrn-A1 allele conferring lateness was associated with resistance to TS and SNB.
关 键 词:Parastagonospora nodorum Pyrenophora tritici-repentis QTL mapping Resistance BREEDING TRITICUM AESTIVUM
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