宇航高速数据电缆用ePTFE薄膜性能研究  

Study on ePTFE Film Properties for Aerospace High-Speed Data Cable

作　　者：任翔[1] 张晋[1] 严莉雅 金倩 REN Xiang;ZHANG Jin;YAN Liya;JING Qian(The 23rd Research Institute,CETC,Shanghai 201900,China)

机构地区：[1]中国电子科技集团公司第二十三研究所

出　　处：《光纤与电缆及其应用技术》2019年第6期12-16,共5页Optical Fiber & Electric Cable and Their Applications

摘　　要：从膨体聚四氟乙烯(ePTFE)薄膜微观泡孔结构、介电性能这两项影响宇航高速数据电缆衰减性能的关键因素出发,对ePTFE薄膜进行了扫描电镜以及介电性能测试。将测得的ePTFE薄膜的微观泡孔结构电镜图像、介电性能与ePTFE薄膜绕包宇航高速数据电缆衰减的测试结果进行对比,发现采用较优介电性能ePTFE薄膜制成的宇航高速数据电缆的衰减并非较优,微观结构中岛状结点中纳米级孔径孔较多的ePTFE薄膜制成的宇航高速数据电缆衰减较小。Based on the two key factors affecting the attenuation performance of aerospace high-speed data cables,the micro-cell structure and dielectric properties of expanded polytetrafluoroethylene(ePTFE)films are investigated by scanning electron microscopy(SEM)and dielectric properties test.By comparing the measured micro-cell structure electron microscopic images and dielectric properties of ePTFE films with the attenuation test results of ePTFE films wrapped around aerospace high-speed data cables,it is found that the attenuation of aerospace high-speed data cables made of ePTFE films with better dielectric properties is not optimal,and the attenuation of aerospace high-speed data cables made of ePTFE films with more nano-aperture cells in island junctions of microstructure is smaller.

关 键 词：膨体聚四氟乙烯 数据电缆 衰减 泡孔结构 

分 类 号：TM248[一般工业技术—材料科学与工程]