费用约束下产品寿命试验与退化试验优化  

Optimization of Product Life Test and Degradation Test under Cost Constraints

作　　者：马心宇 金光[1] 陆峥 MA Xin-yu;JIN Guang;LU Zheng(College of Systems Engineering,National University of Defense Technology,Changsha 410073,China;75831 Troops in the Southern Theatre,Guangzhou 510510,China)

机构地区：[1]国防科技大学系统工程学院,湖南长沙410073 [2]南部战区75831部队,广东广州510510

出　　处：《数学的实践与认识》2019年第23期114-121,共8页Mathematics in Practice and Theory

基　　金：国家自然科学基金(71371183);国家自然科学基金(71071158)

摘　　要：针对Wiener退化失效型产品寿命试验与退化试验优化问题,以Wiener过程和逆高斯分布为依据,用分位寿命渐近方差作为可靠性指标进行了分析.首先比较了退化试验与定时截尾寿命试验的试验设计变量之间关系.然后考虑实际情况,研究试验费用有限情况下,寿命试验和退化试验分别达到渐近方差最小时的最优试验方案设计,发现退化试验的效率高于寿命试验.研究为小子样条件下长寿命产品可靠性试验设计提供了依据.Aim at optimization of life test and degradation test for Wiener degradation failure products,this paper has carried on the analysis regarding this,based on wiener process and inverse Gaussian distribution,when taking asymptotic variance of quantitative life as reliability index.Firstly,we studied the relationship between design variables of degradation test and timing censored life test.Then,considering the actual situation,we put optimal experiment solution design under the microscope,when expense is limited,to minimum asymptotic variance in the life test and degradation test.We found that the efficiency of degradation test is higher than that of life test after comparative test.This paper provided a basis for reliability test design of long-life products under small sample conditions.

关 键 词：Wiener退化过程 寿命试验 退化试验 优化 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]