电子元器件制造中非正态工艺参数的质量控制与评价探讨  

Discussion on Quality Control and Evaluation of Non Normal Process Parameters in Electronic Components Manufacturing

作　　者：谭思亮[1] 许波[1] 王晋荣[1] TAN Si-liang;XU Bo;WANG Jin-rong(The 26th Research Institute of China Electronic Technology Corporation,Chongqing 400060)

机构地区：[1]中国电子科技集团公司第二十六研究所

出　　处：《电子元器件与信息技术》2019年第10期4-5,14,共3页Electronic Component and Information Technology

摘　　要：目前已有的先进技术能够保证电子产品质量,但是由于一些特殊工序的生产特点,导致电子元器件在制造的过程中其工艺参数与正态分布不一致,影响降低了电子元器件的可靠性和稳定性,本文主要对电子元器件制造中非正态工艺参数的质量控制与评价进行了研究,希望能够提供一定的参考。At present,the existing advanced technology can guarantee the quality of electronic products,but due to the production characteristics of some special processes,the process parameters of electronic components are inconsistent with the normal distribution in the manufacturing process,which affects the reliability and stability of electronic components.This paper mainly studies the quality control and evaluation of non normal process parameters in the manufacturing of electronic components.Hope to provide some reference.

关 键 词：电子元器件 非正态工艺参数 质量控制 

分 类 号：TN605[电子电信—电路与系统]