原子光谱分析的电弧光源中元素浓度形成机制的若干讨论  

Some discussions on formation mechanism of element concentration in arc light source of atomic spectral analysis

作　　者：王延龄[1] 张淑仪 WANG Yan-ling;ZHANG Shu-yi(Geologic Experiment Institute of Anhui,Hefei230001,China)

机构地区：[1]安徽省地质实验研究所

出　　处：《冶金分析》2019年第12期80-85,共6页Metallurgical Analysis

摘　　要：论文对原子光谱分析常用条件下,光谱强度公式进行了讨论,重点讨论了电弧中元素浓度的形成机制,因为这个机制是原子光谱分析的核心,其检测的灵敏度和准确度在相当大程度上决定于此,但过去对它的研究和认识很不够。作者多年致力于这方面的研究,并在综合文献资料和实践经验的基础上,提出了电弧的元素浓度形成机制中电弧底部的界面效应观点。这个机制理论不仅解释了原子光谱分析中易、难挥发元素测定困难的问题,也指明了如何改善原子光谱分析的灵敏度和准确度的问题,对原子光谱的深入分析有一定的指导作用。The formula of spectral intensity under common conditions of atomic spectral analysis was discussed.The formation mechanism of element concentration in arc was emphatically discussed because this mechanism was the core of atomic spectral analysis which greatly affected the sensitivity and accuracy of detection.However,the investigation and understanding on this mechanism was very insufficient in the past.The authors had engaged in this area for several years.Based on the references and practical experiences,the viewpoint of interfacial effect on bottom of arc in formation mechanism of element concentration in arc was proposed.By the means of this mechanism,not only the problem that the volatile and non-volatile elements were hardly determined in atomic spectral analysis could be explained,but also the measures to improve the sensitivity and accuracy of atomic spectral analysis were pointed out,which had certain guiding function for the deep analysis of atomic spectroscopy.

关 键 词：原子光谱强度 量子状态参数 界面效应 

分 类 号：O657[理学—分析化学]