灌浆缺陷套筒应力波传播数值模拟研究  

Number Simulation Study on Stress Wave Propagation in Grouting Sleeve With Defects

作　　者：范信凌 许斌[1,2] 夏颂[3] FAN Xinling;XU Bin;XIA Song(College of Civil Engineering,Huaqiao University,Xiamen 361021,China;Key Laboratory for Intelligent Infrastructure and Monitoring of Fujian Province,Huaqiao University,Xiamen 361021,China;Faculty of Electric and Information Engineering,Xi’an Jiaotong University,Xi’an 710049,China)

机构地区：[1]华侨大学土木工程学院,福建厦门361021 [2]华侨大学福建省智慧基础设施与监测重点实验室,福建厦门361021 [3]西安交通大学电子与信息学部,陕西西安710049

出　　处：《压电与声光》2019年第6期793-796,共4页Piezoelectrics & Acoustooptics

基　　金：国家自然科学基金资助项目(51878305);华侨大学科研基金资助项目(605-50Y18016);华侨大学研究生科研创新基金资助项目

摘　　要：灌浆套筒是装配式混凝土结构的关键连接部件,内部灌浆缺陷会严重影响结构力学性能。该文利用机电耦合数值模拟法对基于压电陶瓷驱动下灌浆缺陷套筒内应力波传播特性进行了研究。通过对比健康状况和设置有不同程度灌浆缺陷的套筒模型上的压电陶瓷片测量电压幅值,分析了缺陷与测量信号的关系,并定义了缺陷评价指标评估套筒灌浆缺陷程度。结果表明,套筒灌浆缺陷导致压电片接收压电幅值显著增大。所定义的缺陷评价指标能有效识别套筒内部的灌浆缺陷,基于粘贴压电传感器的应力波测量了用于反映套筒灌浆缺陷的影响。The grouting sleeve is the key connecting part of the precasted concrete(PC)structures,and the internal grouting defects in sleeve will seriously affect the mechanical properties of PC structures.In this paper,the stress wave propagation in the piezoelectric ceramic driven grouting sleeves with different defects is studied numerically by using the electromechanical coupling numerical simulation method.By comparing the health condition and the amplitude measured by the piezoelectric ceramic plate on the grouting sleeve models with different grouting defects,the relationship between the defect and the measured signals is analyzed,and the defect evaluation index is defined to evaluate the degree of grouting defects in the sleeves.The results showed that the grouting defects lead to a significant increase of the received piezoelectric amplitude of the piezoelectric plate.The defined evaluation index can effectively identify the grouting defects inside the sleeves.The stress wave measurement based on the mounted piezoelectric sensor illustrates the effect of sleeve grouting defect.

关 键 词：灌浆套筒 压电陶瓷 应力波 灌浆缺陷检测 数值模拟 

分 类 号：TN384[电子电信—物理电子学]