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作 者:梁志国[1] LIANG Zhiguo(National Key Laboratory of Science and Technology on Metrology&Calibration,Changcheng Institute of Metrology&Measurement,Beijing 100095,China)
机构地区:[1]航空工业北京长城计量测试技术研究所计量与校准技术重点实验室
出 处:《计测技术》2019年第6期20-24,共5页Metrology & Measurement Technology
摘 要:针对不同条件下测量的特点、目的、需求,以及表征和比较中的基本问题,进行了系统分析和讨论;对模型化测量的特点进行了详细分析和讨论,特别针对其中仍然存在的问题,例如测量条件变化、测量系统变化、测量参数变化时,获得的同一被测对象的波形数据结果存在明显差异的问题,提出了一种标准化处理方案。使用几种简单的组合模型方式,进行偏置、平移、幅度归一化,然后再采用模型化处理与表征的结构化方式,统一处理波形测量结果的标准化表征问题。Aiming at objectives,requirements,and basic problems in measurements and comparison under different conditions,the characteristics were systematically analyzed and discussed.At the same time,the characteristics of modeling measurements were also analyzed and discussed in detail.A standardized processing scheme is proposed,especially for the problems that still exist,such as when the measurement condition,the measurement system and the measurement parameter change,the obtained waveform data of the same measured object has obvious difference.By using several simple combined model methods,the offset,translation,amplitude normalization,and then the modeling method of modeling and characterization,this paper has unified processing of the standardized characterization of waveform measurement results.
分 类 号:TB9[一般工业技术—计量学]
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