基于STM32的频率特性测试仪的设计  

Design of Frequency Characteristic Tester Based on STM 32

作　　者：吴涵旭 屈乐乐 韩磊 崔思尧 杨研 WU Han-xu;QU Le-le;HAN Lei;CUI Si-yao;YANG Yan(School of Electronic Information Engineering,Shenyang Aerospace University,Shenyang Liaoning 110136)

机构地区：[1]沈阳航空航天大学电子信息工程学院

出　　处：《数字技术与应用》2019年第11期120-121,共2页Digital Technology & Application

基　　金：沈阳航空航天大学大学生创新训练计划项目(201810143081)

摘　　要：本文提出了一种实用性频率特性测试仪的设计方案。该设计通过分析扫频信号输出性能指标,对相应的信号源和电流型反馈运算放大电路进行结合,使用继电器控制Π型阻抗匹配网络,从而实现了输入和输出衰减网络。为了增加测试功能,采用两片AD8302芯片的方法测量相位差和相位极性。采取STM32处理器作为中央处理器,使整体结构更为简单,解决了国内低频频率特性测试仪功能简单、体积较大、价格昂贵等问题。A practical design of low frequency characteristic tester is proposed in this paper.First,we analyze the output performance index of the swept frequency signal and then design the corresponding signal source and current feedback operational amplifier circuit.The relays are used to control theπimpedance matching network and realize the input and output attenuation networks.In order to increase the testing function,two AD8302 chips are designed to measure the phase difference and phase polarity.The STM32 processor is adopted as the central processor to make the overall structure of system simpler,which solves the problems of the domestic traditional low frequency characteristic tester.

关 键 词：STM32 频率特性测试仪 AD8302 

分 类 号：TN828.6[电子电信—信息与通信工程]