某型存储器模块故障分析  

Fault analysis of a memory module

作　　者：王鹏[1] 许克勤 管强 王兴延 Wang Peng;Xu Keqin;Guan Qiang;Wang Xingyan(China flight test and Research Institute,Xi’an Shaanxi,710089)

机构地区：[1]中国飞行试验研究院

出　　处：《电子测试》2020年第1期108-109,44,共3页Electronic Test

摘　　要：针对任务机内存储器模块存储卡连接器插针接触不良脱焊的质量问题,通过质检数据检查、器件内部结构检查,具体分析了存储器模块存储卡的失效原因,并提出了相应的防护措施,为后期存储器模块的设计改进提出建议并制定相应的预防措施。In view of the quality problem of the bad contact and desoldering of the memory card connector pin in the task machine,through the inspection of the quality inspection data and the inspection of the internal structure of the device,this paper specifically analyzes the failure reasons of the memory card in the memory module,and puts forward the corresponding protective measures,puts forward the suggestions for the design and improvement of the memory module in the future and formulates the corresponding preventive measures.

关 键 词：存储器模块 存储卡 预防措施 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]