缓解NBTI的有效关键门识别方法  

Effective critical gate identification method for mitigating NBTI

作　　者：高磊 李丹青 郑文军 GAO Lei;LI Danqing;ZHENGWenjun(School of Computer Science and Engineering,Anhui University of Science and Technology,Huainan Anhui 232001,China;School of Electronic Science and Applied Physics,Hefei University of Technology,Hefei Anhui 230009,China)

机构地区：[1]安徽理工大学计算机科学与工程学院,安徽淮南232001 [2]合肥工业大学电子科学与应用物理学院,安徽合肥230009

出　　处：《阜阳师范学院学报（自然科学版）》2020年第1期64-68,共5页Journal of Fuyang Normal University(Natural Science)

基　　金：国家自然科学基金项目(61404001,61306046,61371025);安徽省高校省级自然科学研究重大项目(KJ2014ZD12);淮南市科技计划资助项目(2013A4011)资助。

摘　　要：在关键门输入端插入传输门(TG)是缓解负偏置温度不稳定性(NBTI)效应的一种有效方法,因此关键门的精确识别至关重要。针对现有关键门识别方法未考虑关键门输出对后续逻辑门影响的不足,本文提出了一种有效的关键门度量与识别方法。该方法使用路径延迟减法重新确定关键门,同时提出了应用这种有效度量的老化分析框架,最后使用传输门插入算法防护关键门,进一步缓解NBTI引起的老化。结果表明本文的老化延时改进率平均为36.76%,与原有方法相比,面积平均减少了55.08%。Inserting a transmission gate(TG)at the critical gate input is an effective way to mitigate the negative bias temperature instability(NBTI)effect,so accurate identification of critical gate is critical.Aiming at the insufficiency of the critical gate identification method to the subsequent logic gates,this paper proposes an effective critical gate metric and identification method.The method uses path delay subtraction to re-determine the critical gates,at the same time,the aging analysis framework using this effective metric is proposed.Finally,the transmission gate insertion algorithm is used to protect the critical gates to further alleviate the aging caused by NBTI.The experimental results show that the aging delay improvement rate of this paper is 36.76%on average,and the area is reduced by 55.08%compared with the original method.

关 键 词：负偏置温度不稳定性 传输门 关键门 

分 类 号：TN406[电子电信—微电子学与固体电子学]