三栅极离子推力器电子反流失效影响参数的敏感性研究  被引量:3

Parameter Sensitivity Analysis of Electron Backstreaming Failure Mode for 3-Grid System Ion Thruster

在线阅读下载全文

作  者:贾艳辉[1] 王聪 李娟[1] 耿海[1] 郭宁[1] 杨浩[1] 王亮[1] JIA Yan-hui;WANG Cong;LI Juan;GENG Hai;GUO Ning;YANG Hao;WANG Liang(Science and Technology on Vacuum Technology and Physics Laboratory,Lanzhou Institute of Physics,Lanzhou 730000,China)

机构地区:[1]兰州空间技术物理研究所真空技术与物理重点实验室

出  处:《推进技术》2020年第1期140-148,共9页Journal of Propulsion Technology

基  金:科工局技术基础科研项目(JSZL2017203B008);甘肃省科技计划(18JR3RA412)

摘  要:电子反流失效模式是离子推力器关键失效模式之一,决定推力器工作寿命。为明确各参数对电子反流失效模式的影响程度,确定加速应力,为地面加速寿命实验验证方案和长寿命优化设计提供数据支持,采用Hybrid-PIC-MCC(Particle in Cell-Monte Carlo Collision)方法,构建了三栅极系统数值仿真模型。采用模型研究了地面真空舱本底压力、屏栅电压、加速栅电压、屏栅与加速栅间距、屏栅上游等离子体密度和放电室工质利用率等参数的影响敏感度对比。研究结果显示,真空舱本底压力可以作为加速寿命试验的首选加速应力,在推力器结构和工作本征参数中工质利用率为最敏感应力,其次是屏栅电压、屏栅上游等离子体密度、加速栅电压、屏栅和加速栅间距。Electron backstreaming is one of the most important failure modes,which determines the operating lifetime of the ion thruster.To gain the sensitivity effect of kinds of parameters on the electron backstreaming failure mode,and obtain the accelerator stress,and provide data and guidance of the ground accelerator lifetime experimental test and long lifetime optimization design,this paper used the Hybrid-PIC-MCC method and established a 3-grid system simulation model to study the comparison of effect sensitivity of the ground vacuum chamber background pressure,the screen grid potential,the accelerator grid potential,the screen-accelerator grid gap,the plasma density upstream the screen grid and the mass utilization efficiency.Simulation results showed that the ground vacuum chamber background pressure was the first-choice accelerator stress for the accelerator lifetime experimental test.Among the geometric and operating parameters,the mass utilization efficiency was the most sensitive one.Other stress factors include the screen grid potential,the plasma density upstream the screen grid,the accelerator grid potential,and the screen-accelerator grid gap.

关 键 词:离子推力器 三栅极系统 Hybrid-PIC-MCC方法 敏感度 

分 类 号:V439.4[航空宇航科学与技术—航空宇航推进理论与工程]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象