0.632μm激光辐照可见光CCD干扰机理研究  

Study on interference mechanism of visible CCD irradiated by 0. 632 μm laser

作　　者：李楠 LI Nan(School of Information Engineering,Xijing University,Xi^an 710123,China)

机构地区：[1]西京学院信息工程学院

出　　处：《激光杂志》2020年第2期137-140,共4页Laser Journal

摘　　要：利用0.632μm波长激光辐照可见光CCD成像传感器进行激光干扰实验。结果表明,随着激光能量密度的增强,在CCD输出图像中逐渐出现辐照光斑、竖直白线、全屏饱和等典型激光干扰现象。当像面上的激光功率密度达到9.8×10-7W/cm2时,CCD出现光饱和串音,达到2.8 W/cm2时,进入全屏饱和状态。通过分析CCD的结构及材料,发现在光电效应中光生载流子在极短时间内从势阱中溢出,在势垒的阻挡下,沿着竖直方向溢出速度高于水平方向,从而出现竖直白线现象。研究结果丰富了激光对CCD成像器件干扰效应的理解,为激光辐照CCD器件的干扰机理提供了理论依据。The laser interference experiment was carried out by 0.632μm laser irradiation visible light CCD imaging sensor.The results show that along with the enhancement of laser energy density,typical laser interference phenomena such as irradiating spot,vertical white line and full screen saturation appear gradually in the CCD output image.When laser power density on the image surface reaches 9.8×10-7 W/cm2,the CCD becomes light-saturated crosstalk,and when it reaches 2.8 W/cm2,it enters the full-screen saturation state.By analyzing the structure and materials of CCD,it is found that the photo generated carriers overflow from the potential well in a very short period of time,and the vertical overflow velocity is higher than that in horizontal direction under the barrier,thus the phenomenon of vertical white line appears.The results enrich the understanding of laser interference effect on CCD imaging devices and provide a theoretical basis for the interference mechanism of CCD devices irradiated by laser.

关 键 词：激光 CCD 干扰机理 光饱和串音 

分 类 号：TN249[电子电信—物理电子学]