近场EMC测试技术  

Near-field EMC Measurement

作　　者：魏兴昌[1] 丁力[1] Wei Xingchang;Ding Li

机构地区：[1]浙江大学

出　　处：《安全与电磁兼容》2020年第1期15-20,共6页Safety & EMC

摘　　要：随着电探头、磁探头和电磁算法的不断完善,近场扫描技术有望与电磁兼容暗室、微波混响室等一起构成近场、远场一体化的电磁兼容测试系统。总结了近场测试技术的一些进展,主要包括利用感应区的电磁场重构等效辐射源,测量弱辐射体的屏蔽效能,以及多分量电磁探头的设计。With the advancement of the electromagnetic probe and electromagnetic algorithm,near-field scanning is expected to form a near-field and far-field integrated electromagnetic compatibility (EMC) test system,together with EMC anechoic chamber and microwave reverberation chamber.This paper summaries recent development of the near-field EMC testing technology.It mainly includes the reconstruction of equivalent radiation source by scanning electromagnetic field,evaluation of shielding effectiveness of weak radiator based on scanning field,and the design of the multi-components electromagnetic probe.

关 键 词：近场扫描 源重构算法 屏蔽效能 磁场探头 

分 类 号：TN03[电子电信—物理电子学]