圆形薄膜预应力测量  

Measurement of Circular Membrane Prestress

作　　者：谭昭 吴时彬[1] 杨伟[1] 翟嘉[1] Tan Zhao;Wu Shibin;Yang Wei;Zhai Jia(Institute of Optics and Electronics,Chinese Academy of Science,Chengdu 610209,China;University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]中国科学院光电技术研究所,成都610209 [2]中国科学院大学,北京100049

出　　处：《工程塑料应用》2020年第3期109-114,共6页Engineering Plastics Application

基　　金：国家重点研发计划专项(2016YFB0500200)

摘　　要：通过测量薄膜在均匀载荷下的中心挠度变化可以推算出薄膜的预应力,达到无损测量的目的,为了验证这个方法的可行性,运用Von Karman’s方程计算薄膜的挠度与预应力以及均匀载荷的对应关系,并运用有限元软件建立模型对薄膜进行建模分析。设计实验测量薄膜在均匀载荷下的中心挠度大小,根据实验数据运用Von Karman’s方程以及有限元软件进行仿真分析。结果表明,Von Karman’s方程可以用于大径厚比的高分子薄膜材料,可以通过这个方程计算均匀压强下的薄膜中心挠度变化,利用方程推算薄膜预应力的方法能够应用于实际的薄膜上,为薄膜后续使用提供测量预应力的基础。The prestress of film can be calculated by measuring the change of the central deflection of the film under the uniform load.In order to verify the feasibility of this method,Von Karman's equation was used to calculate the relationship between deflection and prestress and uniform load.And the finite element software was used to establish a model for the film modeling analysis.Experiment was designed to measure the central deflection of thin film under uniform load.According to the experimental data,the Von Karman's equation and the finite element software were used to carry out the simulation analysis.The results show that the Von Karman's equation can be used for polymer thin films with large radius-thickness ratio.The central deflection of thin films under uniform pressure can be calculated by this equation,which providing a basis for measuring prestress for subsequent use of thin films.

关 键 词：预应力 圆形薄膜 位移 

分 类 号：TU358[建筑科学—结构工程]