平面相控阵宽角扫描技术  

Wide-Angle Scanning Techniques for Planar Phased Arrays

作　　者：王秉中[1] 丁霄[1] 肖绍球[1] 程友峰 邵维 WANG Bing-zhong;DING Xiao;XIAO Shao-qiu;CHENG You-feng;SHAO Wei(Institute of Applied Physics,University of Electronic Science and Technology of China,Chengdu 610054,China)

机构地区：[1]电子科技大学应用物理研究所,成都610054

出　　处：《微波学报》2020年第1期38-44,共7页Journal of Microwaves

基　　金：国家自然科学基金(重点项目61731005,重大计划90505001,面上/青年60901023,60971029,61101039,61401065,61901398)。

摘　　要：宽角扫描技术是近年来平面相控阵研究领域的热点和难点。从2008年起,电子科技大学计算电磁学团队便开展了相关研究工作,提出了利用方向图可重构技术突破平面相控阵宽角扫描瓶颈的理论和实验方案,并逐步发展了基于电磁镜像原理、表面波辅助设计、磁流源技术、非周期阵列和时间反演自适应优化等理论和方法,用于实现平面相控阵宽角扫描。文章回顾了该团队在平面相控阵宽角扫描领域的研究历程,并对其研究发展做出展望。The wide-angle scanning technique is a hot and difficult issue in the research field of planar phased arrays in recent years. Since 2008, Computational Electromagnetics Laboratory(CEMLAB) at University of Electronic Science and Technology of China(UESTC) has carried out related research work, and proposed a theoretical and experimental scheme to break the bottleneck of the limitation of planar phased array scanning angles by using the pattern reconfigurable technique. Subsequently, CEMLAB conducted in-depth research and gradually developed theoretical methods based on the electromagnetic image principle, surface wave assisted method, magnetic current source technique, aperiodic array, and time reversal(TR) adaptive optimization method to realize planar phased arrays with wide-angle scanning performance. This paper reviews the research history of wide-angle scanning planar phased arrays in CEMLAB and predicts the development trend of wide-angle scanning planar phased arrays.

关 键 词：平面相控阵 宽角扫描 方向图可重构 优化 时间反演 

分 类 号：TN821.8[电子电信—信息与通信工程]