光谱仪参数对测得光谱线特性影响规律的研究  

Research of the Influence of Spectrograph Parameters on Features of Measured Spectrum

作　　者：程继宇 CHENG Jiyu(School of Mathematics and Physics, North China Electric Power University, Baoding 071000, China)

机构地区：[1]华北电力大学(保定)数理学院物理系,河北保定071000

出　　处：《安徽电气工程职业技术学院学报》2020年第1期120-125,共6页Journal of Anhui Electrical Engineering Professional Technique College

基　　金：华北电力大学大学生创新创业训练项目资助(项目编号:20191176)。

摘　　要：光谱采集特性与光谱仪参数设置密切相关,文章从光谱仪结构出发探究光谱仪参数设置与测得的光谱线宽度和强度之间的定量关系。发现实验测得的光谱线宽度与光谱仪出射、入射狭缝宽度成线性曲线,倍增管电压和测得谱线强度成幂指数曲线,理论与实验基本符合。得出结论,谱线宽度和入射、出射狭缝成线性关系;倍增管电压和测得谱线强度成幂指数关系。This paper investigates the relationship between the parameters of spectrograph and the features of measured spectrum in the manner of theory and experiment.In this paper,the quantitative relationship between spectrograph parameter setting and measured spectral line width and intensity is studied from the perspective of spectrometer structure.It is found that the measured spectral line width is a linear curve with the width of spectrometer emission and incident slit,and the voltage of multiplier tube and the measured spectral line strength are a power exponential curve.It is concluded that there is a linear relationship between the width of the spectral line and the incident and outgoing slits.The relationship between the voltage of the multiplier tube and the intensity of the measured line is exponential.

关 键 词：狭缝宽度 倍增管电压 谱线宽度 谱线强度 光谱仪参数 

分 类 号：O433.1[机械工程—光学工程]