AgNWs-rGO复合透明导电薄膜的制备及其稳定性研究  

Preparation and Stability of AgNWs-rGO Composite Transparent Conductive Films

作　　者：张志秦 胡跃辉 张效华 王迪 王鹏飞 朱文均 高浩 ZHANG Zhiqiri;HU Yuehui;ZHANG Xiaohua;WANG Di;WAND Pengfei;ZHU Wenjun;GAO Hao(School of Mechanical and Electronic Engineering,Jingdezhen Ceramic Institute,Jingdezhen 333403,Jiangxi,China)

机构地区：[1]景德镇陶瓷大学机械电子工程学院,江西景德镇333403

出　　处：《陶瓷学报》2020年第1期47-51,共5页Journal of Ceramics

基　　金：国家自然科学基金(6146005);江西省科技厅重点研发计划项目(20171BBE50053);江西省主要学科科学带头人项目(20123BCB22002)。

摘　　要：通过Hummer′s法制备了还原氧化石墨烯(rGO),将rGO包裹在银纳米线表面,通过旋涂法在PET/玻璃衬底上制备了AgNWs-rGO复合透明导电薄膜。利用XRD对薄膜的晶型进行了测定,发现制备的还原氧化石墨烯品质优良,薄膜结晶质量良好;通过SEM观察到rGO很好地附着在AgNWs表面,并利用拉曼光谱分析对其缺陷尺寸进行了表征;运用紫外分光光度计对薄膜的透过率进行测试,结果显示复合薄膜具有良好的透过性,当照射光源波长为550 nm时,薄膜的透过率为89%以上。此外,AgNWs-rGO还表现出优良的稳定性,将薄膜机械弯曲总计一千次,每弯曲两百次平均上升方阻为13.97Ω/□。Reduced graphene oxide(rGO)was prepared by using the Hummer′s method and was coated on silver nanowires(Ag NWs).Then,transparent conductive films were formed on PET/glass substrates by using spin coating method.Phase composition and structure of the films were examined by using X-ray diffraction(XRD),indicating that the rGO had a high degree of crystallization.The presence of r GO on the surface of Ag NWs was confirmed by using scanning electron microscopy(SEM),revealing that small rGO pieces were well attached onto the surface of the Ag NWs.At the same time,the defect characteristic was analyzed by using Raman spectroscopy.Transmittance of the films was measured by using ultraviolet spectrophotometer,with an optimal transmittance of 89%at 550 nm.In addition,the Ag NWs-r GO also showed excellent mechanical stability,with the square resistance to be increased by ju st 13.97Ω/□after bending for 200 times.

关 键 词：还原氧化石墨烯 PET/玻璃衬底 稳定性 

分 类 号：TQ174.75[化学工程—陶瓷工业]