单像素成像在三维测量中的应用  

Application of single pixel imaging in 3D measurement

作　　者：姜宏志[1,2] 李宇曦 赵慧洁 Jiang Hongzhi;Li Yuxi;Zhao Huijie(Key Laboratory of Precision Opto-mechatronics Technology,Ministry of Education,School of Instrumentation and Optoelectronic Engineering,Beihang University,Beijing 100191,China;Beihang University Qingdao Research Institute,Qingdao 266101,China)

机构地区：[1]北京航空航天大学,仪器科学与光电工程学院,精密光机电一体化技术教育部重点实验室,北京100191 [2]北京航空航天大学,青岛研究院,山东青岛266101

出　　处：《红外与激光工程》2020年第3期221-229,共9页Infrared and Laser Engineering

基　　金：国家自然科学基金重点项目(61735003)。

摘　　要：在条纹投影等传统结构光三维测量技术中,在全局光照的干扰下,无法获得高质量、高精度的三维测量结果。典型的全局光照效应包括互反射和次表面散射。互反射发生在凹陷的光亮反射表面,而次表面散射发生在半透明材料表面。单像素成像(Single-pixel imaging, SI)技术可以通过没有空间分辨率的探测器捕获场景,然而,大多数现代数码相机采用传统像素化的图像传感器。在这里,我们提出了将单像素成像技术扩展到像素化的图像传感器中,将图像传感器上的每个像素都被视为是一个独立的单像素成像单元,可以同时获取图像。实验表明,这种单像素成像方法可以完全分解直接光照和全局光照,实现在全局光照干扰下的高质量、高精度三维重建。Traditional optical 3D shape measurement methods, such as Fringe projection techniques, cannot acquire high-quality and high-accuracy 3D measurement results in the presence of global illumination. Typical global illumination effects contain interreflections and subsurface scattering. Interreflections occur in concave surfaces with glossy reflection, and subsurface scattering occurs in translucent materials. Single-pixel imaging(SI) techniques can capture a scene through a detector with no spatial resolution. However, traditional pixelated imaging sensors are commonly adopted in most modern digital cameras. Here, we extended SI to pixelated imaging sensors, in which every pixel on an imaging sensor was considered an independent unit that can simultaneously obtain an image. Our experiments show that the SI can completely decompose direct and global illumination. Furthermore, high-quality and high-accuracy 3D profile in the presence of global illumination can be reconstructed.

关 键 词：单像素成像 互反射 次表面散射 三维测量 

分 类 号：O439[机械工程—光学工程]