9MeV,小于0.1mm微焦点X射线源验证实验  

Verification experiment of micro focus X-ray source with energy 9 MeV and beam size less than 0.1 mm

作　　者：李鹏[1] 王建新[1] 肖德鑫[1] 周征 周奎[1] 李世根[1] 劳成龙 沈旭明[1] 闫陇刚[1] 刘宇[1] 刘婕[1] 胡栋才 吴岱[1] 杨兴繁[1] 黎明[1] Li Peng;Wang Jianxing;Xiao Dexin;Zhou Zheng;Zhou Kui;Li Shigen;Lao Chenglong;Shen Xuming;Yang Longang;Liu Yu;Liu Jie;Hu Dongcai;Wu Dai;Yang Xingfan;Li Ming(Institute of Applied Electronics,CAEP,Mianyang 621900,China)

机构地区：[1]中国工程物理研究院应用电子学研究所,四川绵阳621900

出　　处：《强激光与粒子束》2020年第5期69-70,共2页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(11975218,11905210,11805192);中国工程物理研究院创新发展基金项目(CX2019036,CX2019037)。

摘　　要：密度高、成像分辨率高、成像速度快的X射线数字成像检测需要高能微焦点大剂量X射线源,高品质电子源是实现这一X射线源的关键手段。基于中国工程物理研究院太赫兹自由电子激光的主加速器,验证了低发射度、低能散度的高亮度电子束实现高能微焦点的可行性,得到电子束半高全宽尺寸小于70μm的9 MeV微焦点,并初步开展成像实验,双丝像质计焦斑清晰分辨9D号丝,丝直径0.13 mm。High-density,high-resolution,and high-speed X-ray digital imaging detection requires a high-energy microfocus and high-dose X-ray source.A high quality electron beam source is the key means to achieve this X-ray source.Based on the main accelerator of the terahertz free electron laser of the China Academy of Engineering Physics(CTFEL),a high-energy microfocus X-ray source achieved by the high-brightness electron beam with low emittance and low energy spread was verified.The 9 MeV electron beam with full width at half-maximum of less than 70μm was obtained.An initial imaging experiment was also carried out.The focal spot of the dual-wire image quality meter clearly distinguished the 9D wire with a wire diameter of 0.13 mm.

关 键 词：微焦点 高能X射线源 高亮度电子源 自由电子激光 高能工业CT 

分 类 号：TG115.28[金属学及工艺—物理冶金]