某机载电子系统低温启动故障分析  

Analysis of a Start-up Failure in Airborne Electronic Systemunder Low Temperature

作　　者：孙瑞婷 周流畅 Sun Rui-ting;Zhou Liu-chang(CSIC 723 Institute,Jiangsu Yangzhou 225001)

机构地区：[1]中船重工集团公司第723研究所,江苏扬州225001

出　　处：《电子质量》2020年第4期29-32,共4页Electronics Quality

摘　　要：该文针对某机载电子系统环境试验过程中出现的低温启动故障,首先,采用故障树法对各个因素进行排除实现了故障定位,确定了CAN接口芯片在低温启动时的某种故障模式,然后根据故障机理在板级电路和整机系统实现了故障的稳定复现,证明了故障定位的准确性;最后制定了改进措施并通过试验验证了措施的有效性。A start-up failure in airborne electronic system under low temperature is analyzed in this paper.With a fault tree,various causes are eliminated and the fault location is found.A certain fault mode of CAN interface chip in the low-temperature start-up is determined.Then,according to the fault mechanism,the stable recurrence of the fault is realized in the board level circuit and the whole system,which proves the accuracy of the fault location.Finally,the improvement measures are made and the effectiveness of the measures is verified by experiments.

关 键 词：低温启动 故障分析 故障树 故障复现 接口芯片 CAN 

分 类 号：V243[航空宇航科学与技术—飞行器设计]